<import Submit="Submit entry" database="DB_sharpes" datafiles="Fig2_PRL_103_226803_Sprinkle.jpg;" dataset="Fig2_PRL_103_226803_Sprinkle.jpg" date="Mon Aug 17 10:37:36 2026" uid="982502eff1fedd2cc8fd1c7b5002bb41a3788f996579e215318d78f3608d83da" url="https://data-analysis.synchrotron-soleil.fr/sharpes/db/EXPERIMENT_2009-11-27_982502eff1fedd2cc8fd1c7b5002bb41a3788f996579e215318d78f3608d83da" user_id="tejeda">
  <experiment date_begin="2009-11-27" description="" title="Graphene on SiC%28000-1%29" uid="EXPERIMENT_2009-11-27_982502eff1fedd2cc8fd1c7b5002bb41a3788f996579e215318d78f3608d83da" variable_parameters_types="temperature ">
    <parameters_instrument polarization="" spectrum_scan_number="">
      <spatial extent_x="" extent_y="" extent_z="" />
      <spectral>
        <ranges>
          <range resolution="7 meV" sampling="" />
        </ranges>
      </spectral>
    </parameters_instrument>
    <publication citation="10.1103%2FPhysRevLett.103.226803" />
    <spectra>
      <spectrum analysis="" reference_position="The scan in ky is perpendicular to the SiC %3C10-10%3E direction at the K point." />
    </spectra>
    <types type="laboratory measurement " />
  </experiment>
  <experimentalist email="" family_name="">
    <laboratories laboratory="" />
  </experimentalist>
  <experiments comments="" variable_parameters_comments="" />
  <instrument comments="" name="" source="synchrotron " source_energy="30" source_power="" spectral_analyzers="" technique="ARPES">
    <detectors detector="" />
  </instrument>
  <sample comments="" name="Graphene" substrate_material="SiC" thickness="11 layers">
    <material chemical_formula="C%2FSiC%28000-1%29" family="2D" phase_name="" />
    <parameters_environment temperature="6" />
    <processings processing_steps="The graphene layers were grown in a closed rf induction furnace at a temperature of 1550 %B0C" />
    <publication citation="" />
  </sample>
</import>
