<import Submit="Submit entry" database="DB_sharpes" datafiles="Fig2_PRB_86_195438_Stoffel.jpg;" dataset="Fig2_PRB_86_195438_Stoffel.jpg" date="Wed Aug 19 10:46:38 2026" uid="b87777e39471e0d22345cde2e14b807b9102c8a8ee0ecd9bfcef20f4d826c524" url="https://data-analysis.synchrotron-soleil.fr/sharpes/db/EXPERIMENT_2012-11-30_b87777e39471e0d22345cde2e14b807b9102c8a8ee0ecd9bfcef20f4d826c524" user_id="">
  <experiment date_begin="2012-11-30" description="" title="Strained Ge%2FSi%28111%29-%285x5%29 surface" uid="EXPERIMENT_2012-11-30_b87777e39471e0d22345cde2e14b807b9102c8a8ee0ecd9bfcef20f4d826c524" variable_parameters_types="temperature ">
    <parameters_instrument polarization="" spectrum_scan_number="">
      <spatial extent_x="" extent_y="" extent_z="" />
      <spectral>
        <ranges>
          <range resolution="10 meV" sampling="" />
        </ranges>
      </spectral>
    </parameters_instrument>
    <publication citation="10.1103%2FPhysRevB.86.195438 " />
    <spectra>
      <spectrum analysis="" reference_position="" />
    </spectra>
    <types type="laboratory measurement " />
  </experiment>
  <experimentalist email="" family_name="">
    <laboratories laboratory="" />
  </experimentalist>
  <experiments comments="" variable_parameters_comments="" />
  <instrument comments="" name="" source="synchrotron " source_energy="21.2" source_power="" spectral_analyzers="" technique="ARPES">
    <detectors detector="" />
  </instrument>
  <sample comments="" name="Strained Ge on Si%28111%29" substrate_material="Si%28111%29" thickness="">
    <material chemical_formula="Ge%2FSi%28111%29" family="" phase_name="" />
    <parameters_environment temperature="RT" />
    <processings processing_steps="in-situ evaporation" />
    <publication citation="10.1103%2FPhysRevB.86.195438 " />
  </sample>
</import>
